Current projects in display metrology at the NIST flat panel display laboratory
- Author(s):
- Boynton, P.A. ( National Institute of Standards and Technology (USA) )
- Kelley, E.F.
- Libert, J.M.
- Publication title:
- Fourth Oxford Conference on Spectroscopy : 10-12 June 2002, Davidson, North Carolina, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4826
- Pub. Year:
- 2003
- Page(from):
- 165
- Page(to):
- 175
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819446008 [0819446009]
- Language:
- English
- Call no.:
- P63600/4826
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Diagnostics for light-measuring devices in flying-spot display measurements
SPIE - The International Society for Optical Engineering |
2
Conference Proceedings
Standard illumination source for the evaluation of display measurement methods and instruments
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Color gamut assessment standard: construction, characterization, and interlaboratory measurement comparison
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Comparing methodologies for determining resolution from contrast in projection display systems (Invited Paper)
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Light measuring device diagnostics for the photometric and colorimetric measurement of flying-spot displays
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Stray light compensation in small area contrast measurements of projection displays
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |