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Thermal imaging of microwave power GaAs-FET with scanning thermal nanoprobe

Author(s):
Joodaki, M. ( Univ. Kassel (Germany) )
Janus, P. ( Wroclaw Univ. of Technology (Poland) )
Gotszalk, T.
Kompa, G. ( Univ. Kassel (Germany) )
Edinger, K. ( Univ. of Maryland/College Park (USA) )
Rangelow, I.W. ( Univ. Kassel (Germany) )
1 more
Publication title:
Nanoscale Optics and Applications
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4809
Pub. Year:
2002
Page(from):
202
Page(to):
207
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445773 [0819445770]
Language:
English
Call no.:
P63600/4809
Type:
Conference Proceedings

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