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Generalized ellipsometry of complex mediums in layered systems (Key Lecture)

Author(s):
Schubert, M. ( Univ. Leipzig (Germany) )
Kasic, A.
Hofmann, T.
Gottschalch, V. ( Univ. Leipzig (Germany) )
Off, J. ( Univ. Stuttgart (Germany) )
Scholz, F.
Schubert, E. ( Institut fuer Oberflaechenmodifizierung (Germany) )
Neumann, H.
Hodgkinson, I.J. ( Univ. of Otago (New Zealand) )
Arnold, M.D.
Dollase, W.A. ( Univ. of California/Los Angeles (USA) )
Herzinger, C.M. ( J.A. Woollam Co., Inc. (USA) )
7 more
Publication title:
Complex mediums III : beyond linear isotropic dielectrics : 8-10 July 2002, Seattle, [Washington] USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4806
Pub. Year:
2002
Page(from):
264
Page(to):
276
Pages:
13
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445742 [0819445746]
Language:
English
Call no.:
P63600/4806
Type:
Conference Proceedings

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