Performance analysis of an integrated pin/MISS OEIC for high-current photosensing applications

Performance analysis of an integrated pin/MISS OEIC for high-current photosensing applications

Author(s):

Ho, J.-J. ( Fortune Institute of Technology (Taiwan) )
Fang, Y.-K. ( National Cheng-Kung Univ. (Taiwan) )
Chen, C.-Y. ( Fortune Institute of Technology (Taiwan) )

Publication title:

Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4795

Pub. Year:

2002

Page(from):

193

Page(to):

199

Pages:

7

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445629 [0819445622]

Language:

English

Call no.:

P63600/4795

Type:

Conference Proceedings

Details

TDL ID:	ZA00012632
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Materials for Infrared Detectors
Conf. info. (Number):	2002 : 2nd
Conf. info. (Venue):	Seattle, WA, USA
Conf. info. (Date):	2002.07.08-2002.07.09

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