Current mode operation of a Cd0.9Zn0.1Te detector for CT imaging
- Author(s):
Barber, W.C. ( Univ. of California/San Francisco (USA) ) Iwata, K. Hasegawa, B.H. Bennett, P.R. ( Radiation Monitoring Devices, Inc. (USA) ) Cirignano, L.J. Shah, K.S. - Publication title:
- Penetrating Radiation Systems and Applications IV
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4786
- Pub. Year:
- 2002
- Page(from):
- 144
- Page(to):
- 150
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819445537 [0819445533]
- Language:
- English
- Call no.:
- P63600/4786
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Progress in developing a combined x-ray CT and SPECT system using CdZnTe detector
SPIE - The International Society for Optical Engineering |
7
Conference Proceedings
CdTe and Cd0.9Zn0.1Te crystal growth and characterization for nuclear spectrometers [6319A-29]
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Photoluminescence Investigation of Surface Oxidation of Cd0.9 Zn0.1 Te Detectors
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Crystal growth, characterization, and testing of Cd0.9Zn0.1Te single crystals for radiation detectors
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
4
Conference Proceedings
Bismuth iodide crystals as a detector material:some optical and electrical properties
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
5
Conference Proceedings
Crystal Growth and Characterization of CdTe and Cd₀.₉Zn₀.₁Te for Nuclear Radiation Detectors
Materials Research Society |
11
Conference Proceedings
Low Temperature Crystal Growth and Characterization of Cd0.9Zn0.1Te for Radiation Detection Applications
Materials Research Society |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |