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Development of compound semiconductor detectors for x- and gamma-ray spectroscopy (Invited Paper)

Author(s):
Owens, A. ( European Space Agency/ ESTEC (Netherlands) )
Anderson, H. ( Metorex International Oy (Finland) )
Bavdaz, M. ( European Space Agency/ESTEC (Netherlands) )
Erd, C.
Gagliardi, T. ( Metorex Inc. (USA) )
Gostilo, V. ( Baltic Scientific Instruments (Latvia) )
Haack, N. ( HASYLAB/DESY (Germany) )
Krumrey, M.K. ( Physikalisch-Technische Bundesanstalt (Germany) )
Laemsae, V. ( Metorex International Oy (Finland) )
Lumb, D.H. ( European Space Agency/ESTEC (Netherlands) )
Lisjutin, I. ( Baltic Scientific Instruments (Latvia) )
Major, I. ( Metorex Inc. (USA) )
Nenonen, S.A.A. ( Metorex International Oy (Finland) )
Peacock, A.J. ( European Space Agency/ESTEC (Netherlands) )
Sipila, H. ( Metorex International Oy (Finland) )
Zatoloka, S. ( Baltic Scientific Instruments (Latvia) )
11 more
Publication title:
X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4784
Pub. date:
2002
Page(from):
244
Page(to):
258
Pages:
15
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445513 [0819445517]
Language:
English
Call no.:
P63600/4784
Type:
Conference Proceedings

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