Development of compound semiconductor detectors for x- and gamma-ray spectroscopy (Invited Paper)

Development of compound semiconductor detectors for x- and gamma-ray spectroscopy (Invited Paper)

Author(s):

Owens, A. ( European Space Agency/ ESTEC (Netherlands) )

Anderson, H. ( Metorex International Oy (Finland) )

Bavdaz, M. ( European Space Agency/ESTEC (Netherlands) )

Erd, C.

Gagliardi, T. ( Metorex Inc. (USA) )

Gostilo, V. ( Baltic Scientific Instruments (Latvia) )

Haack, N. ( HASYLAB/DESY (Germany) )

Krumrey, M.K. ( Physikalisch-Technische Bundesanstalt (Germany) )

Laemsae, V. ( Metorex International Oy (Finland) )

Lumb, D.H. ( European Space Agency/ESTEC (Netherlands) )

Lisjutin, I. ( Baltic Scientific Instruments (Latvia) )

Major, I. ( Metorex Inc. (USA) )

Nenonen, S.A.A. ( Metorex International Oy (Finland) )

Peacock, A.J. ( European Space Agency/ESTEC (Netherlands) )

Sipila, H. ( Metorex International Oy (Finland) )

Zatoloka, S. ( Baltic Scientific Instruments (Latvia) )

11 more

Publication title:

X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4784

Pub. Year:

2002

Page(from):

244

Page(to):

258

Pages:

15

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445513 [0819445517]

Language:

English

Call no.:

P63600/4784

Type:

Conference Proceedings

Details

TDL ID:	ZA00012621
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : SPIE Conference on Hard X-ray and Gamma-ray Detector Physics ; Conference on X-ray Detectors
Conf. info. (Number):	2002 : 4th ; 2002
Conf. info. (Venue):	Seattle, WA, USA
Conf. info. (Date):	2002.07.07-2002.07.09

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