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Recent results from thin-film-coated semiconductor neutron detectors (Invited Paper)

Author(s):
McGregor, D.S. ( Kansas State Univ. (USA) )
Klann, R.T. ( Argonne National Lab. (USA) )
Sanders, J.D.
Lindsay, J.T. ( Inner Vision (USA) )
Linden, K.J. ( Spire Corp. (USA) )
Gersch, H.K. ( Univ. of Michigan (USA) )
De Lurgio, P.M. ( Argonne National Lab. (USA) )
Fink, C.L.
Ariesanti, E. ( Kansas State Univ. (USA) )
4 more
Publication title:
X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4784
Pub. Year:
2002
Page(from):
164
Page(to):
182
Pages:
19
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445513 [0819445517]
Language:
English
Call no.:
P63600/4784
Type:
Conference Proceedings

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