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Physical analysis of high-intensity focusing x-ray optics: doubly curved crystals vs. highly focusing polycapillaries

Author(s):
  • Formica, S. ( Univ. at Albany and X-Ray Optical Systems, Inc. (USA) )
  • Lee, S.M. ( Univ. at Albany (USA) )
Publication title:
Advances in laboratory-based X-ray sources and optics III : 8 July, 2002, Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4781
Pub. Year:
2002
Page(from):
77
Page(to):
86
Pages:
10
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445483 [0819445487]
Language:
English
Call no.:
P63600/4781
Type:
Conference Proceedings

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