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Analysis and characterization of surface defects in ophthalmic lenses

Author(s):
Pladellorens, J.M. ( Univ. Politecnica de Catalunya (Spain) )
Caum, J.
Tapias, M.
Cadevall, C.
Anto, J.
Fernandez, X. ( Industrias de Optica, SA (Spain) )
1 more
Publication title:
Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4780
Pub. Year:
2002
Page(from):
99
Page(to):
106
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445476 [0819445479]
Language:
English
Call no.:
P63600/4780
Type:
Conference Proceedings

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