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Optical processing for the detection of faults in interferometric patterns

Author(s):
Kallmeyer, F. ( Humboldt-Univ. zu Berlin (Germany) )
Krueger, S.
Wernicke, G.K.
Gruber, H.
Demoli, N. ( Institute of Physics (Croatia) )
Osten, W. ( Bremen Institute of Applied Beam Technology (Germany) )
Kayser, D.
2 more
Publication title:
Interferometry XI: Techniques and Analysis
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4777
Pub. Year:
2002
Page(from):
371
Page(to):
381
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445445 [0819445444]
Language:
English
Call no.:
P63600/4777
Type:
Conference Proceedings

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