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Influence of defects on electrical and optical characteristics of GaN/InGaN-based light-emitting diodes

Author(s):
Cao, X.A. ( GE Global Research Ctr. (USA) )
Topol, K. ( Univ. at Albany (USA) )
Shahedipour-Sandvik, F.
Teetsov, J. ( GE Global Research Ctr. (USA) )
Sandvik, P.M.
LeBoeuf, S.E.
Ebong, A.
Kretchmer, J.W.
Stokes, E.B.
Arthur, S.
Kaloyeros, A.E. ( Univ. at Albany (USA) )
Walker, D. ( GE Global Research Ctr. (USA) )
7 more
Publication title:
Solid state lighting II : 9-11 July, 2002, Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4776
Pub. Year:
2002
Page(from):
105
Page(to):
113
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445438 [0819445436]
Language:
English
Call no.:
P63600/4776
Type:
Conference Proceedings

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