Calculation of spectral degradation due to contaminant films on infrared and optical sensors

Calculation of spectral degradation due to contaminant films on infrared and optical sensors

Author(s):

Gamble, L. ( Utah State Univ. (USA) )
Dennison, J.R.
Wood, B.E. ( Bob Wood Aerospace Consulting Services, Inc. (USA) )
Herrick, J. ( Utah State Univ. (USA) )
Dyer, J.S.

Publication title:

Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4774

Pub. Year:

2002

Page(from):

111

Page(to):

118

Pages:

8

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445414 [081944541X]

Language:

English

Call no.:

P63600/4774

Type:

Conference Proceedings

Details

TDL ID:	ZA00012611
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Optical System Contamination
Conf. info. (Number):	2002 : 7th
Conf. info. (Venue):	Seattle, WA, USA
Conf. info. (Date):	2002.07.09-2002.07.11

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