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Cleanliness validation of NIF small optics

Author(s):
Chow, R. ( Lawrence Livermore National Lab. (USA) )
Bickel, R.C.
Ertel, J.
Pryatel, J.
Loomis, G.E.
Stowers, I.F.
Taylor, J.R.
2 more
Publication title:
Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4774
Pub. Year:
2002
Page(from):
19
Page(to):
28
Pages:
10
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445414 [081944541X]
Language:
English
Call no.:
P63600/4774
Type:
Conference Proceedings

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