Testing system of photo detector of PIN photodiode

Testing system of photo detector of PIN photodiode

Author(s):

Fu, R. ( Nanjing Univ. of Sceince and Technology (China) )
Chang, B.
Qian, Y.
Zong, Y.Z.
Zhan, Q.H.

Publication title:

Electro-optical system design, simulation, testing, and training : 9-10 July 2002, Seattle, Washington, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4772

Pub. Year:

2002

Page(from):

144

Page(to):

154

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445391 [0819445398]

Language:

English

Call no.:

P63600/4772

Type:

Conference Proceedings

Details

TDL ID:	ZA00012609
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Electro-Optical System Design, Simulation, Testing, and Training
Conf. info. (Number):	2002
Conf. info. (Venue):	Seattle, WA, USA
Conf. info. (Date):	2002.07.09-2002.07.10

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