Blank Cover Image

Pilot study on the technique of tolerance analysis based on virtual assembly

Author(s):
Publication title:
Third International conference on virtual reality and its application in industry : 9-12 April 2002, Hangzhou, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4756
Pub. Year:
2003
Page(from):
280
Page(to):
285
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445193 [0819445193]
Language:
English
Call no.:
P63600/4756
Type:
Conference Proceedings

Similar Items:

Zhengshu Shen, Jami J. Shah, Joseph K. Davidson

American Society of Mechanical Engineers

B. Dong, Q. Zhao, S. He, S. Hu, T. Guo, L. Xue

SPIE - The International Society of Optical Engineering

Chen, W., Wang, S., Li, Z., Feng, C.

SPIE-The International Society for Optical Engineering

Ma, Y., Zhang, Y., Cui, T.

SPIE-The International Society for Optical Engineering

M.A. Haque, S. Mahalakshmi, R. Nanwal

Trans Tech Publications

H.-M. Xin, J. Zhang, Y. Ma, T.-W. Cui

ESA Publications Division

Y. Ma, J. Zhang, T. Cui

ESA Communications

Cui H., Pei X., Ma H., Ma S.

SPIE - The International Society of Optical Engineering

T. Cui, J. Zhang, Y. Ma

Society of Photo-optical Instrumentation Engineers

C.-C. Cheng, T.-Y. Lin, R.-H. Chen

Society of Photo-optical Instrumentation Engineers

Yang, Z., Li, Y.Q., He, Y.J., Cui, X., Yoshino, T.T.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12