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Possibility of determination of parameters of nanolayers by the modified Kretchman's scheme

Author(s):
Publication title:
ICONO 2001: Quantum and Atomic Optics, High-Precision Measurements in Optics, and Optical Information Processing, Transmission, and Storage
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4750
Pub. Year:
2002
Page(from):
187
Page(to):
191
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445131 [0819445134]
Language:
English
Call no.:
P63600/4750
Type:
Conference Proceedings

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