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Measurement and Modelling of SOI MOSFETs Capacitances

Author(s):
Tomaszewski, D.
Lukasiak, L.
Gibki, J.
Domanski, K.
Jakubowski, A.
Zareba, A.
1 more
Publication title:
Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001)
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4746
Pub. date:
2002
Vol.:
VOL-1
Page(from):
725
Page(to):
728
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445001 [0819445002]
Language:
English
Call no.:
P63600/4746
Type:
Conference Proceedings

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