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Advanced imaging sensors at Rockwell Scientific Company (Invited Paper)

Author(s):
Montroy, J.T. ( Rockwell Scientific Co., LLC (USA) )
Garnett, J.D.
Cabelli, S.A.
Loose, M.
Joshi, A.B.
Hughes, G.W.
Kozlowski, L.J.
Haas, A.K.
Wong, S.S.
Zandian, M.
Chen, A.C.
Pasko, J.G.
Farris, M.C.
Cabelli, C.A.
Cooper, D.E.
Arias, J.M.
Bajaj, J.
Vural, K.
13 more
Publication title:
Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4721
Pub. date:
2002
Page(from):
212
Page(to):
226
Pages:
15
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819444714 [0819444715]
Language:
English
Call no.:
P63600/4721
Type:
Conference Proceedings

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