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Hardware-in-the-loop sensor testing using measured and modeled signature data with the real-time IR/EO scene simulator (RISS)

Author(s):
Publication title:
Technologies for synthetic environments : hardware-in-the-loop testing VII : 1-2 April 2001, Orlando, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4717
Pub. Year:
2002
Page(from):
206
Page(to):
216
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819444677 [0819444677]
Language:
English
Call no.:
P63600/4717
Type:
Conference Proceedings

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