Defect detection for short-loop process and SRAM-cell optimization by using addressable failure site-test structures(AFS-TS)
- Author(s):
Doong, K.Y.-Y. ( Taiwan Semiconductor Manufacturing Co., Ltd. and National Tsing-Hua Univ. (Taiwan) ) Hsieh, S. ( Taiwan Semiconductor Manufacturing Co., Ltd. ) Lin, S.C. Wang, J.R. ( National Tsing-Hua Univ. (Taiwan) ) Shen, B. ( Taiwan Semiconductor Manufacturing Co., Ltd. ) Hung, L.J. Guo, J.C. Chen, I.C. Young, K.L. Hsu, C.C.-H. ( National Tsing-Hua Univ.(Taiwan) ) - Publication title:
- Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4692
- Pub. Year:
- 2002
- Page(from):
- 81
- Page(to):
- 87
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444394 [0819444391]
- Language:
- English
- Call no.:
- P63600/4692
- Type:
- Conference Proceedings
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