
Development of low-loss optical coatings for 157-nm lithography
- Author(s):
Biro, R. ( Association of Super-Advanced Electronics Technologies (Japan) ) Sone, K. ( Canon Inc. (Japan) ) Niisaka, S. ( Association of Super-Advanced Electronics Technologies (Japan) ) Otani, M. ( Association of Super-Advanced Electronics Technologies (Japan) ) Suzuki, Y. ( Canon Inc. (Japan) ) Ouchi, C. Saito, T. ( Association of Super- Advanced Electronics Technologies (Japan) ) Hasegawa, M. ( Association of Super-Advanced Electronics Technologies (Japan) ) Saito, J. ( Association of Super-Advanced Electronics Technologies (Japan) ) Tanaka, A. ( Nikon Corp. (Japan) ) Matsumoto, A. - Publication title:
- Optical Microlithography XV
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4691
- Pub. Year:
- 2002
- Vol.:
- Part Two
- Page(from):
- 1625
- Page(to):
- 1634
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444370 [0819444375]
- Language:
- English
- Call no.:
- P63600/4691
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
![]() SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
3
![]() SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
10
![]() SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
11
![]() SPIE-The International Society for Optical Engineering |
6
![]() SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |