Measurement of the flare and in-field linewidth variation due to the flare
- Author(s):
- Jeong, T.M. ( Samsung Electronics Co., Ltd. (Korea) )
- Choi, S.-W.
- Woo, S.-G.
- Han, W.-S.
- Sohn, J.-M.
- Publication title:
- Optical Microlithography XV
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4691
- Pub. Year:
- 2002
- Vol.:
- Part Two
- Page(from):
- 1465
- Page(to):
- 1473
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444370 [0819444375]
- Language:
- English
- Call no.:
- P63600/4691
- Type:
- Conference Proceedings
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