CD prediction by threshold energy resist model (TERM)
- Author(s):
Yoo, J.-Y. ( Hanyang Univ. (Korea) ) Kwon, Y.-K. Park, J.-T. Sohn, D.-S. Kim, S.-G. Sohn, Y.-S. Oh, H.-K. - Publication title:
- Optical Microlithography XV
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4691
- Pub. Year:
- 2002
- Vol.:
- Part Two
- Page(from):
- 1287
- Page(to):
- 1295
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444370 [0819444375]
- Language:
- English
- Call no.:
- P63600/4691
- Type:
- Conference Proceedings
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