System qualification and optimization for imaging performance on the 0.80-NA 248-nm step-and-scan systems
- Author(s):
van Ingen Schenau, K. ( ASML (Netherlands) ) Bakker, H. Zellenrath, M. Moerman, R. Linders, J. Rohe, T. ( Carl Zeiss (Germany) ) Emer, W. - Publication title:
- Optical Microlithography XV
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4691
- Pub. Year:
- 2002
- Vol.:
- Part One
- Page(from):
- 637
- Page(to):
- 651
- Pages:
- 15
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444370 [0819444375]
- Language:
- English
- Call no.:
- P63600/4691
- Type:
- Conference Proceedings
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