Wavelet and statistical analysis for melanoma classification

Wavelet and statistical analysis for melanoma classification

Author(s):

Nimunkar, A.J. ( Univ. of Wisconsin/Madison (USA) )
Dhawan, A.P. ( New Jersey Institute of Technology (USA) )
Relue, P.A. ( Univ. of Toledo (USA) )
Patwardhan, S.V. ( New Jersey Institute of Technology (USA) )

Publication title:

Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4684

Pub. Year:

2002

Vol.:

Part Three

Page(from):

1346

Page(to):

1353

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

16057422

ISBN:

9780819444295 [0819444294]

Language:

English

Call no.:

P63600/4684

Type:

Conference Proceedings

Details

TDL ID:	ZA00012515
Series ID:	PA00000029
Conf. info. (Name):	Medical Imaging
Conf. info. (Number):	2002
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2002.02.24-2002.02.28

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