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Noise properties of the inverse π-scheme exponential radon transform

Author(s):
Publication title:
Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4684
Pub. Year:
2002
Vol.:
Part Two
Page(from):
790
Page(to):
796
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819444295 [0819444294]
Language:
English
Call no.:
P63600/4684
Type:
Conference Proceedings

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