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Analysis of factors affecting the light collection efficiency in CT detector: CWO+PIN diode

Author(s):
Kwak, S.-W. ( Korea Advanced Institute of Science and Technology )
Kim, K.H. ( Hyun Dae Nuclear Co., Lte. (Korea) )
Kim, H.K. ( Korea Advanced Institute of Science and Technology )
Cho, G.
Ahn, S.K.
Goh, S.M. ( Chonbuk National Univ. (Korea) )
Lee, Y. ( Korea Univ. )
Park, J.B. ( Listem Corp. (Korea) )
3 more
Publication title:
Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4682
Pub. Year:
2002
Page(from):
612
Page(to):
619
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819444271 [0819444278]
Language:
English
Call no.:
P63600/4682
Type:
Conference Proceedings

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