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Noise properties of a Se-based flat-panel x-ray detector with CMOS readout integrated circuits

Author(s):
Adachi, S. ( Shimadzu Corp. (Japan) )
Hirasawa, S.
Takahashi, M. ( Sharp Corp. (Japan) )
Okada, H.
Yamane, Y.
Yamada, S. ( Shimadzu Corp. (Japan) )
1 more
Publication title:
Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4682
Pub. Year:
2002
Page(from):
580
Page(to):
591
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819444271 [0819444278]
Language:
English
Call no.:
P63600/4682
Type:
Conference Proceedings

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