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Proton radiation damage in high-resistivity n-type silicon CCDs

Author(s):
Bebek, C.J. ( Lawrence Berkeley National Lab. (USA) )
Groom, D.E.
Holland, S.E.
Karcher, A.
Kolbe, W.F.
Lee, J.S.
Levi, M.E.
Palaio, N.P.
Turko, B.T.
Uslenghi, M.C.
Wagner, M.T.
Wang, G.
7 more
Publication title:
Sensors and camera systems for scientific, industrial, and digital photography applications III : 21-23 January, 2002, San Jose, [California], USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4669
Pub. Year:
2002
Page(from):
161
Page(to):
171
Pages:
11
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819444097 [081944409X]
Language:
English
Call no.:
P63600/4669
Type:
Conference Proceedings

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