Stuctural, optical, and electrical characterization of ZnO/Zn0.8Mg0.2O quantum wells for UV applications (Invited Paper)

Stuctural, optical, and electrical characterization of ZnO/Zn0.8Mg0.2O quantum wells for UV applications (Invited Paper)

Author(s):

Iliadis, A.A. ( Univ. of Maryland/College Park (USA) )

Publication title:

Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4650

Pub. Year:

2002

Page(from):

67

Page(to):

74

Pages:

8

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443892 [0819443891]

Language:

English

Call no.:

P63600/4650

Type:

Conference Proceedings

Details

TDL ID:	ZA00012478
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Photodetector materials and devices
Conf. info. (Number):	2002 : 7th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2002.01.21-2002.01.23

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