Characterization of VCSELs model output using near-field scanning optical microscopy

Characterization of VCSELs model output using near-field scanning optical microscopy

Author(s):

Bradford, W.C. ( Colorado School of Mines (USA) )
Beach, J.D.
Collins, R.T.
Kisker, D.W. ( Cielo Communications, Inc. (USA) )
Galt, D.

Publication title:

Vertical-Cavity Surface-Emitting Lasers VI

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4649

Pub. Year:

2002

Page(from):

77

Page(to):

86

Pages:

10

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443885 [0819443883]

Language:

English

Call no.:

P63600/4649

Type:

Conference Proceedings

Details

TDL ID:	ZA00012477
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Vertical-cavity surface-emitting lasers
Conf. info. (Number):	2002 : 6th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2002.01.23-2002.01.24

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