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High-power high-brightness ridge-waveguide tapered diode at 940 nm

Author(s):
Kelemen, M.T. ( Faunhofer-Institut fuer Angewandte Festkoerperhpysik (Germany) )
Rinner, F.
Rogg, J.
Wiedmann, N.
Kiefer, R.
Walther, M.
Mikulla, M.
Weimann, G.
3 more
Publication title:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4648
Pub. Year:
2002
Page(from):
75
Page(to):
81
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443878 [0819443875]
Language:
English
Call no.:
P63600/4648
Type:
Conference Proceedings

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