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Failure mode analysis of high-power laser diodes (Invited paper)

Author(s):
Ahrens, R..G. ( Lucent Technologies/Bell Labs. (USA) )
Jaques, J.J.
Dutta, N.K. ( Univ. of Connecticut (USA) )
LuValle, M.J. ( OFS Fitel (USA) )
Piccirilli, A.B. ( Lucent Technologies/Bell Labs. (USA) )
Camarde, R.M.
Fields, A.B.
Lawrence, K.R.
3 more
Publication title:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4648
Pub. Year:
2002
Page(from):
30
Page(to):
42
Pages:
13
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443878 [0819443875]
Language:
English
Call no.:
P63600/4648
Type:
Conference Proceedings

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