Simulation of hot-electron effect in negative-electron-affinity GaN pn junction diodes
- Author(s):
- Fardi, H.Z. ( Univ. of Colorado/Denver(USA) )
- Alaghband, G.
- Publication title:
- Physics and Simulation of Optoelectronic Devices X
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4646
- Pub. Year:
- 2002
- Page(from):
- 574
- Page(to):
- 582
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819443854 [0819443859]
- Language:
- English
- Call no.:
- P63600/4646
- Type:
- Conference Proceedings
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