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Improved effective index method for oxide-confined VCSEL mode analysis

Author(s):
  • Ng, W.-C. ( Univ. of Illinois/Urbana-Champaign(USA) )
  • Liu, Y.
  • Klein, B.D. ( National Institute of Standard and Technology(USA) )
  • Hess, K. ( Univ. of Illinois/Urbana-Champaign(USA) )
Publication title:
Physics and Simulation of Optoelectronic Devices X
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4646
Pub. Year:
2002
Page(from):
168
Page(to):
175
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443854 [0819443859]
Language:
English
Call no.:
P63600/4646
Type:
Conference Proceedings

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