Graded-index profile analysis from M-line, DNS, and EDS measurements of glass waveguides produced by K+/Ag+ ion-exchange combinations

Graded-index profile analysis from M-line, DNS, and EDS measurements of glass waveguides produced by K+/Ag+ ion-exchange combinations

Author(s):

Pelli, S. ( IROE-CNR(Italy) )
Righni, G.C.
Pereira, M.B. ( Univ. Federal do Rio Grande do Sul (Brazil) )
Horowitz, F.

Publication title:

Integrated Optics: Devices, Materials, and Technologies VI

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4640

Pub. Year:

2002

Page(from):

9

Page(to):

14

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443793 [0819443794]

Language:

English

Call no.:

P63600/4640

Type:

Conference Proceedings

Details

TDL ID:	ZA00012468
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Integrated optics
Conf. info. (Number):	2002 : 6th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2002.01.21-2002.01.23

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