Consequences of combined chemical and radiative exposure of solid surfaces (Invited Paper)

Consequences of combined chemical and radiative exposure of solid surfaces (Invited Paper)

Author(s):

Dickinson, J.T. ( Washington State Univ. (USA) )
Dawes, M.L.
Nwe, K.H.
Langford, S.C.

Publication title:

Photon Processing in Microelectronics and Photonics

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4637

Pub. Year:

2002

Page(from):

1

Page(to):

12

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443762 [081944376X]

Language:

English

Call no.:

P63600/4637

Type:

Conference Proceedings

Details

TDL ID:	ZA00012465
Series ID:	PA00000029
Conf. info. (Name):	SPIE LASE : Photon processing in microelectronics and photonics
Conf. info. (Number):	2002
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2002.01.21-2002.01.24

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