Blank Cover Image

Importance of high-throughput cell separation technologies for genomics/proteomics-based clinical diagnostics

Author(s):
Leary, J.F. ( Univ.of Texas Medical Branch at Galveston(USA) )
Szaniszlo, P.
Prow, T.W.
Reece, L.M.
Wang, N.
Asmuth, D.M.
1 more
Publication title:
Clinical diagnostic systems : technologies and instrumentation : 22-24 January 2002, San Jose, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4625
Pub. Year:
2002
Page(from):
1
Page(to):
8
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819443649 [0819443646]
Language:
English
Call no.:
P63600/4625
Type:
Conference Proceedings

Similar Items:

Leary,J.F., Reece,L.N., Szaniszlo,P., Prow,T.W., Wang,N.

SPIE-The International Society for Optical Engineering

J.F. Leary, S.R. McLaughlin

Society of Photo-optical Instrumentation Engineers

Prow, T.W., Salazar, J.H., Rose, W.A., Smith, J.N., Reece, L., Fontenot, A.A., Wang, N.A., Lloyd, R.S., Leary, J.F.

SPIE - The International Society of Optical Engineering

Leary,J.F., Hokanson,J.A., Rosenblatt,J.I., Reece,L.N.

SPIE-The International Society for Optical Engineering

Smith, J.N., Reece, L., Szaniszlo, P., Leary, R.C., Leary, J.F.

SPIE - The International Society of Optical Engineering

Leary, J.F., Reece, L.M., Hokanson, J.A., Rosenblatt, J.I.

SPIE-The International Society for Optical Engineering

Prow, T. W., Rose, W. A., Wang, N., Reece, L. M., Lvov, Y., Leary, J. F.

SPIE - The International Society of Optical Engineering

J. F. Leary, J. Smith, P. Szaniszlo, L. M. Reece

SPIE - The International Society of Optical Engineering

Leary, J. F., Reece, L. M., Yang, X., Gorenstein, D.

SPIE - The International Society of Optical Engineering

Leary,J.F., He,F., Reece,L.N.

SPIE - The International Society for Optical Engineering

Leary,J.F., He,F., Reece,L.M.

SPIE - The International Society for Optical Engineering

M. Seale, D. Zemlyanov, C. L. Cooper, E. Haglund, T. W. Prow, L. M. Reece, J. F. Leary

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12