High-resolution spectral self-interference fluorescence microscopy

High-resolution spectral self-interference fluorescence microscopy

Author(s):

Swan, A.K. ( Boston Univ. (USA) )

Moiseev, L.

Tong, Y.

Lipoff, S.H. ( Boston Univ. Acadermy (USA) )

Karl, W. C. ( Boston Univ. (USA) )

Goldberg, B.B.

UEnlue, M.S.

2 more

Publication title:

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing IX

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4621

Pub. Year:

2002

Page(from):

77

Page(to):

85

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

16057422

ISBN:

9780819443601 [0819443603]

Language:

English

Call no.:

P63600/4621

Type:

Conference Proceedings

Details

TDL ID:	ZA00012449
Series ID:	PA00000029
Conf. info. (Name):	SPIE BiOS : Three-Dimensional and Multidimensional Microscopy
Conf. info. (Number):	2002 : 9th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2002.01.22-2002.01.23

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