Measurement of optoelectron lifetime in imaging process of silver halide material
- Author(s):
- Publication title:
- Semiconductor Optoelectronic Device Manufacturing and Applications
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4602
- Pub. Year:
- 2001
- Page(from):
- 339
- Page(to):
- 343
- Pages:
- 5
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819443410 [0819443417]
- Language:
- English
- Call no.:
- P63600/4602
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Computer simulation of photpelectron decay process of silver halide microcrystals
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
The Influence of electron trap on photoelectron decay behavior in silver halide
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
Measurement of the behaviors of the optoelectron in photosensitive material by dielectric spectrum technology
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Image density property of optical information recording microcapsule material
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
5
Conference Proceedings
Properties of shallow electron trap dopants in AgCl optical storage materials
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |