Blank Cover Image

Measurement of the behaviors of the optoelectron in photosensitive material by dielectric spectrum technology

Author(s):
Publication title:
Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4600
Pub. Year:
2001
Page(from):
96
Page(to):
100
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443397 [0819443395]
Language:
English
Call no.:
P63600/4600
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Measurement of optoelectron lifetime in imaging process of silver halide material

Fu, G., Yang, S., Li, X., Hu, X.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Measurement of broadband fiber-grating transmission spectrum using tunable fiber grating ring laser

Wang,J., Liu,Z., Ge,C., Yu,Y., Zhang,Y., Li,Z., Dong,X., Cjoamg.K.S.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Computer simulation of photosensitive process of image materials

Li,X., Sun,Y., Hu,X., Zhang,L.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Measurement system for the fatigue behavior of magneto-optical recording films

Li,Z., Wang,K., Tan,L., Yang,X., Hu,Z.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Study on the photosensitivity of photosensitive fibers

Zhang, D., Jiang, L., Ren, Q., Li, J., Zhou, C., Liu, S., Jiang, D., Kai, G., Dong, X.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings Application of diazonaphthoquinone/novolak photosensitive material for photography image formation

P. L. Zhang, H. L. Yu, S. Hu, Z. Y. Jin, L. Wang, L. C. Zhang, Y. Yang

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Research of the wavelet based ECW remote sensing image compression technology

L. Zhang, X. Gu, T. Yu, Y. Dong, X. Hu

Society of Photo-optical Instrumentation Engineers
10 Conference Proceedings New electrode materials for dielectric elastomer actuators

W. Yuan, T. Lam, J. Biggs, L. Hu, Z. Yu, S. Ha, D. Xi, M. K. Senesky, G. Gruner, Q. Pei

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Computer simulation of optoelectronic behavior in image materials

Li, X., Sun, Y., Fu, G., Zhang, L., Han, L.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Transition of luminance mode in dielectric barrier discharge

Y. Li, L. Dong, W. Fan

Society of Photo-optical Instrumentation Engineers
6 Conference Proceedings Behaviors of free electrons and shallow-trapped eletrons in sulfer-sensitized silvur halide material

Lu, X.D., Han, L., Yang, S.P., Li, X.W., Geng, A.C.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Spectrum of dielectric barrier discharge in atmosphere

Mao, Z., Dong, L., Ran, J.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12