Variable aperture and dynamic scanning noise measurement system of photoelectric imaging device

Variable aperture and dynamic scanning noise measurement system of photoelectric imaging device

Author(s):

Bai, L. ( Nanjing Univ. of Science and Tecnology (China) )
Sun, S.
Xu, R.
Zhang, B.

Publication title:

Photonic systems and applications : 27-30 November 2001, Singapore

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4595

Pub. Year:

2001

Page(from):

231

Page(to):

236

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443250 [0819443255]

Language:

English

Call no.:

P63600/4595

Type:

Conference Proceedings

Details

TDL ID:	ZA00012423
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Photonics and Applications : Photonic systems and applications
Conf. info. (Number):	2001
Conf. info. (Venue):	Singapore
Conf. info. (Date):	2001.11.27-2001.11.30

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