Growth and characterization of crack-free GaN films grown on crackd Si-doped GaN templates

Growth and characterization of crack-free GaN films grown on crackd Si-doped GaN templates

Author(s):

Sia, E.K. ( Institute of Materials Research and Engineering (Singapore) )

Hao, M.S.

Chua, S.J.

Tiginyanu, I.M. ( Technical Univ. of Moldova )

Ichizli, V. ( Technische Univ. Darmstadt (Germany) )

Mutamba, K.

Hartnagel, H.L.

Zhang, J. ( National Univ. of Singapore )

Tripathy, S.

4 more

Publication title:

Design, fabrication, and characterization of photonic devices : 27-30 November 2001, Singapore

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4594

Pub. Year:

2001

Page(from):

201

Page(to):

210

Pages:

10

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443243 [0819443247]

Language:

English

Call no.:

P63600/4594

Type:

Conference Proceedings

Details

TDL ID:	ZA00012422
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Photonics and Applications : Design, fabrication, and characterization of photonic devices
Conf. info. (Number):	2001
Conf. info. (Venue):	Singapore
Conf. info. (Date):	2001.11.27-2001.11.30

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