Thin film characterization using terahertz differential time-domain spectroscopy and double modulation
- Author(s):
Mickan, S.P. ( Rensselaer Polytechnic Institute (USA) ) Lee, K.-S. ( Rensselaer Polytechnic Institute (USA) ) Lu, T.-M. Barnat, E. Munch, J. ( Adelaide Univ. (Australia) ) Abbott, D. Zhang, X.-C. ( Rensselaer Polytechnic Institute (USA) ) - Publication title:
- Electronics and structures for MEMS II : 17-19 December 2001, Adelaide, Australia
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4591
- Pub. Year:
- 2001
- Page(from):
- 197
- Page(to):
- 209
- Pages:
- 13
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819443212 [0819443212]
- Language:
- English
- Call no.:
- P63600/4591
- Type:
- Conference Proceedings
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