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Electrical noise used to estimate the reliability of high-power semiconductor lasers

Author(s):
Publication title:
APOC 2001: Asia-Pacific Optical and Wireless Communications : Optoelectronics, Materials, and Dvices for Communications : 13-15 November 2001, Beijing, Chaina
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4580
Pub. Year:
2001
Page(from):
482
Page(to):
485
Pages:
4
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443106 [0819443107]
Language:
English
Call no.:
P63600/4580
Type:
Conference Proceedings

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