Electrical noise used to estimate the reliability of high-power semiconductor lasers
- Author(s):
- Publication title:
- APOC 2001: Asia-Pacific Optical and Wireless Communications : Optoelectronics, Materials, and Dvices for Communications : 13-15 November 2001, Beijing, Chaina
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4580
- Pub. Year:
- 2001
- Page(from):
- 482
- Page(to):
- 485
- Pages:
- 4
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819443106 [0819443107]
- Language:
- English
- Call no.:
- P63600/4580
- Type:
- Conference Proceedings
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