Machine vision systems using machine learning for industrial product inspection
- Author(s):
- Lu, Y. ( Univ. of Michigan/Dearborn(USA) )
- Chen, T.Q.
- Chen, J.
- Zhang, J.
- Tisler, A. ( Jabil Circuit, Inc.(USA) )
- Publication title:
- Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4567
- Pub. Year:
- 2002
- Page(from):
- 161
- Page(to):
- 170
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819442956 [081944295X]
- Language:
- English
- Call no.:
- P63600/4567
- Type:
- Conference Proceedings
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