Theopold, K. H., Reinaud, O. M., Doren, D., Konecny, R.
Elsevier
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Byrne, Erin K., Douglas, Trevor, Theopold, Klaus H.
Materials Research Society
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Bregeault, J. -M., Ali, B. El, Mercier, J., Martin, J., Martin, C., Mohammedi, O.
Elsevier
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Barzoukas,M., Blanchard-Desce,M.H.
SPIE-The International Society for Optical Engineering
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Zeng, H. C., Qian, M., Pang, X. Y.
Elsevier
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Li, Yuejin, Armor, John
American Institute of Chemical Engineers
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Fukuzumi, S., Imahori, H., Okamoto, K., Yamada, H., El-Khouly, M.E., Fujitsuka, M., Ito, O., Guldi, D.M.
Electrochemical Society
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Schrijver,H., Goede,A.P.H., Dobber,M.R., Buchwitz,M.
SPIE-The International Society for Optical Engineering
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Prati, L., Rossi, M.
Elsevier
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Koinuma, H., Yoshimoto, M., Takagi, Y., Sawaoka, A. B., Hashimoto, T., Nagai, T., Shiraishi, T.
Materials Research Society
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Ogale, S. B., Teli, Seema, Chopda, Sunita, Phase, D. M., Kanetkar, S. M.
Materials Research Society
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Finocchio, E., Daturi, M., Binet, C., Lavalley, J. C., Fally, F., Perrichon, V., Vidal, H., Kaspar, J., Graziani, M., …
Elsevier
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