Blank Cover Image

Single-crystal silicon triple-torsional micro-oscillators for use in magnetic resonance force microscopy

Author(s):
Publication title:
MEMS components and applications for industry, automobiles, aerospace, and communication : 22-23 October 2001, San Francisco, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4559
Pub. Year:
2001
Page(from):
24
Page(to):
35
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442871 [0819442879]
Language:
English
Call no.:
P63600/4559
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Oscillator microfabrication, micromagnets, and magnetic resonance force microscopy

Choi, J.-H., Mirsaidov, U.M., Miller, C.W., Lee, Y.J., Guchhait, S., Chabot, M.D., Lu, W., Markert, J.T.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings Single-spin measurement by magnetic resonance force microscopy: effects of measurement device, thermal noise, and spin relaxation

Goan, H.-S., Brun, T.A.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Microfabrication of single-crystal silicon multiple torsional oscillators

Chabot,M.D., Markert,J.T.

SPIE - The International Society for Optical Engineering
8 Conference Proceedings ION BEAM SYNTHESIS OF BURIED SINGLE CRYSTAL ERBIUM SILICIDE

Golanski, A., Feenstra, R., Galloway, M.D., Park, J.L., Pennycook, S.J., Harmon, H.E., White, C.W.

Materials Research Society
3 Conference Proceedings Laser-ablated thin films of infinite-layer compounds and related materials

Markert,J.T., Messina,T.C., Dam,B., Huijbregste,J., Rector,J.H., Griessen,R.

SPIE - The International Society for Optical Engineering
9 Conference Proceedings Resonance Production in Relativistic Heavy Ion Collisions

Markert, C.

Kluwer Academic Publishers
4 Conference Proceedings Magnetic resonance force microscopy and the solid state quantum computer

Pelekhov, D.V., Martin, I., Suter, A., Reagor, D.W., Hammel, P.C.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Failure of Micron Scale Single Crystal Silicon Bars Due to Torsion Developed By MEMS Micro Instruments

Saif, Taher, MacDonald, N. C.

MRS - Materials Research Society
5 Conference Proceedings Pulse shortening in the magnetically insulated line oscillator(MILO)

Agee,F.J., Calico,S.E., Hendricks,K.J., Haworth,M.D., Spencer,T.A., Ralph,D.L., Blankenship,E., Clark,M.C., Lemke,R.W.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Measurements of Resonance Frequency of Parylene Microspring Arrays Using Atomic Force Microscopy

C. Gaire, M. He, A. Zandiatashbar, P.-I. Wang, R.C. Picu, G.-C. Wang, T.-M. Lu

Materials Research Society
6 Conference Proceedings Atomic force microscope using a diamond tip: atool for micro/nanomachining on single-crystal silicon surface

Zhao, Q., Sun, T., Liang, Y., Dong, S., Chen, M.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Investigations of charge transfer and photosensitivity in single-and double-doped LiNbO3 single crystals: an optical-electron paramagnetic resonance study: I

Darwish,A.M., Aggarwal,M.D., Morris,J., Choi,J., Wang,J.C., Venkateswarlu,P., Williams,A., Banerjee,P.P., McMillen,D.K., …

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12