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Selection and attributes of objective function of electro-optical system vulnerbility to ECM(EOSVECM)

Author(s):
Zhang,J. ( National Univ. of Defense Technology )
Zhou,Y.
An,W.
Jiang,W.
Lu,Q.
Huang,H.
1 more
Publication title:
Data mining and applications : 23-24 October 2001, Wuhan, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4556
Pub. Year:
2001
Page(from):
110
Page(to):
115
Pages:
6
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442840 [0819442844]
Language:
English
Call no.:
P63600/4556
Type:
Conference Proceedings

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