Blank Cover Image

Application of fuzzy pattern recognition in intelligent fault diagnosis systems

Author(s):
Publication title:
Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4554
Pub. date:
2001
Vol.:
4554
Page(from):
262
Page(to):
267
Pages:
6
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442826 [0819442828]
Language:
English
Call no.:
P63600/4554
Type:
Conference Proceedings

Similar Items:

D. Zhang, Y. Wang, H. Huang

Society of Photo-optical Instrumentation Engineers

H. Liu, Y. Wang, B. Liang, S. Shen

SPIE - The International Society of Optical Engineering

2 Conference Proceedings Fuzzy Diagnosis of Tapping Process Fault

H.L. Xue, L. Wang, X.Y. Chen, G.C. Wang

Trans Tech Publications

H. Liu, P. Ouyang, S. Wang

SPIE - The International Society of Optical Engineering

Deng H., Wang T., He H., Xu Y.

SPIE - The International Society of Optical Engineering

Na,S.Y., Park,M.S., Hwang,W.-C., Kee,C.-D.

SPIE - The International Society for Optical Engineering

L. Liu, H. Wang

Society of Photo-optical Instrumentation Engineers

He H. -L, Wang T. -Y, Deng H., Zeng J. -X, Wang G. -F, Rao J.

SPIE - The International Society of Optical Engineering

H. Liu, X. Wang

Society of Photo-optical Instrumentation Engineers

Hao, L. N., Chen, W. L., Zhang, X. F., Wang, W. S.

Trans Tech Publications

Hector Galicia, Jin Wang, Qinghua He

American Institute of Chemical Engineers

Rezeki,S.M.S., Chan,W., Haskard,M.R., Mulcahy,D.E., Davey,D.E.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12